Electronic Component Testing Services

Quality Compliance

• ISO 9001:2008
• MIL-I-45208

Equivalent Testing To

• MIL-M-38510
• MIL-PRF-38535
• MIL-PRF-19500
• MIL-STD-202
• MIL-STD-750
• MIL-STD-883
• MIL-STD-981
• MIL-HDBK-454

Electrical Testing/Burn-In
Extensive test program library with capabilities for AC, DC parametric and functional evaluation and testing of a wide variety of devices ranging from diodes and transistors to more complex linear, LSI, VLSI technologies, as well as complete bench test set-ups for non-standard parameters and passive components. Static/Dynamic Burn-In with positions are available for most package styles.

• Up Screening - Industrial Temperature
• Ac Parametrics
• Burn-In
• Life Testing
• Read & Record
• Go/No-Go
• Pre & Post Electrical
• Memory Testing
• Comparative Analysis

Environmental Testing

• Solderability/Tinning
• Stabilization Bake
• Humidity Testing
• Temperature Cycle
• Centrifuge
• Hermeticity (FINE/GROSS Leak)
• Particle Impact Noise Detection (PIND)

Custom Services

• Device Programming & Erasure
• Marking
• Bar Coding
• Dpa/Failure Analysis
• Selection Testing
• Engineering Evaluation

Facilities Listing

Tape and Reel & Dry Packaging

• Tape and Reel - Q-Corp QMT-1100D
• Counter - Q-Corp QC-100
• Vacuum Seal - Amerivacs AVS-20
• Dry Packaging

Memory Testing

• Darkhorse Systems Sigma II dc parametric performed of DRAM devices
• Darkhorse Systems Sigma LC functional testing of DRAM

Digital Testing

• Logue McDonald LMO500 - 384 I/O-100MHz
• Gen Rad 1732M Test Systems dc and parametric measurements
• Logue McDonald 324B-5 Test Systems - dc and parametric measurements along w/propagation delays

Linear Testing

• Analog Devices LTS2020
• Analog Devices LTS2010 - Parametric and functional testing capabilities for linear device such as
• Op Amps, Comparators, Regulators, DAC's and ADC's

Discrete Testing

• Scientific Test 5150 Test Systems with High Voltage and High Current capability
• Scientific Test 5300 Test Systems with Low Current capability and multiple section DUT scanner deck - ability to record pre and post burn-in measurements - deltas calculated

Relay Testing

• Markenrich RT160 Relay Tester

Crystal Testing

• Saunders & Associates 250A Crystal Test System

Passive Testing

• Gen Rad 1689 RLC Digibridge Test System
• Gen Rad 1687 BLC Digibridge Test System
• Gen Rad 1684 Megohmmeter

Programming

• Digital I/O Unisite Systems - Variety of fixtures for a large assortment of devices
• Data I/O PSX1000 Parallel Programmer-capabilities to program up to 10 devices at a time
• BP Micro BP1400/84

UV Erasure

• UVEProm Erasing Cabinet

Labeling

• Brady Printer TMT 200M assortment of labels for all types of packages - kapton labels for high temperature applications

Temperature Testing

• Temptronics TP04000 Series Thermostream -65C to 200C
• Thermonics T2420SX-7 Temperature Forcing Systems capability of device environment of -65C to 200C
• Thermonics T-2820 Precision Temperature Forcing System -65C to 200C

Burn-In Capabilities

• Liner
• Digital
• Discrete
•     Despatch PBC2-16
•     Blue M
•     Capability to perform static on a variety of packages from standard diodes to complex BGA. Dynamic performed at customer request

Temperature Cycling Air To Air

• Blue M WSP 109B3X16 capable of automatic transfer to satisfy MIL-STD-883 Method 1010 and MIL-STD-750 Method 1051

Gross Leak Testing

• Trio-Tech 481 Test Systems

Particle Impact Noise Detection (PIND)

• Dunegan/Endevco 4501A capability to satisfy MIL-STD-883 Method 2020 and MIL-STD-750 Method 2052

Call eComp today and let us show you our Electronic Component Testing Services and our Commitment to Quality!
Call us at 508-881-8399 or call toll-free 1-877-463-2667 or email us now.